Scanning Electron Microscope (SEM - JEOL -6490LV) - microscopy services

  • Sharon White (Manager)

Facility/equipment: Equipment

Equipments Details

Description

The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter.

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