Barry Brennan received a PhD in Physics from Dublin City University in 2010, which primarily focused on surface characterisation of III-V semiconductor materials using X-ray photoelectron spectroscopy (XPS). Subsequently he continued this research during Post-Doctoral studies at the University of Texas at Dallas, incorporating characterisation of high-k metal oxide thin films deposited in-situ on various III-V surfaces, as well as studying optimal methods to remove deleterious native oxides from the high-k/III-V interfaces through chemical and physical means.

In 2014, Barry joined the National Centre of Excellence in Mass Spectrometry Imaging and the National Graphene Metrology Centre at the National Physical Laboratory, UK, working on the characterisation of 2D nanomaterials (graphene, hBN, MoS2 etc.) using Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and XPS. The principal aim of this work was to identify the chemical composition of these materials, including the level and nature of contaminants and defects on their surfaces. This information could be used to gain insights into the growth mechanisms associated with chemical vapour deposition growth of 2D materials on metal catalysis, or aid identification of the dispersion of nanomaterials in polymer composites.

Barry joined ATU in April 2022 as a Staff Research Scientist continuing his interest in chemical and surface characterisation of nanomaterials for various applications. He has published over 80 papers in peer reviewed scientific journals.