Accumulation capacitance frequency dispersion of III-V metal-insulator-semiconductor devices due to disorder induced gap states

Rohit V Galatage, Dmitry M Zhernokletov, Hong Dong, B Brennan, Christopher L Hinkle, Robert M Wallace, Eric M Vogel

Research output: Contribution to journalArticlepeer-review

Original languageUndefined/Unknown
JournalJournal of Applied Physics
Volume116
Issue number1
Publication statusPublished - 2014

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