Original language | Undefined/Unknown |
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Journal | Journal of Applied Physics |
Volume | 116 |
Issue number | 1 |
Publication status | Published - 2014 |
Accumulation capacitance frequency dispersion of III-V metal-insulator-semiconductor devices due to disorder induced gap states
Rohit V Galatage, Dmitry M Zhernokletov, Hong Dong, B Brennan, Christopher L Hinkle, Robert M Wallace, Eric M Vogel
Research output: Contribution to journal › Article › peer-review