Chemical and electrical characterization of the HfO2/InAlAs interface

Barry Brennan; Rohit V Galatage; K Thomas; Emanuele Pelucchi; Paul K Hurley; Jiyoung Kim; Christopher L Hinkle; Eric M Vogel; Robert M Wallace

Chemical and electrical characterization of the HfO2/InAlAs interface

Barry Brennan
, Rohit V Galatage
, K Thomas
, Emanuele Pelucchi
, Paul K Hurley
, Jiyoung Kim
, Christopher L Hinkle
, Eric M Vogel
, Robert M Wallace

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Original language	Undefined/Unknown
Journal	Journal of Applied Physics
Volume	114
Issue number	10
Publication status	Published - 2013

Cite this

@article{009dc7786e154a38ae7df7495ec210d0,

title = "Chemical and electrical characterization of the HfO2/InAlAs interface",

author = "Barry Brennan and Galatage, \{Rohit V\} and K Thomas and Emanuele Pelucchi and Hurley, \{Paul K\} and Jiyoung Kim and Hinkle, \{Christopher L\} and Vogel, \{Eric M\} and Wallace, \{Robert M\}",

year = "2013",

language = "Undefined/Unknown",

volume = "114",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "AIP Publishing",

number = "10",

}

TY - JOUR

T1 - Chemical and electrical characterization of the HfO2/InAlAs interface

AU - Brennan, Barry

AU - Galatage, Rohit V

AU - Thomas, K

AU - Pelucchi, Emanuele

AU - Hurley, Paul K

AU - Kim, Jiyoung

AU - Hinkle, Christopher L

AU - Vogel, Eric M

AU - Wallace, Robert M

PY - 2013

Y1 - 2013

M3 - Article

SN - 0021-8979

VL - 114

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

ER -