Growth, ambient stability and electrical characterisation of MgO thin films on silicon surfaces

P Casey; E O’Connor; R Long; B Brennan; SA Krasnikov; D O’Connell; PK Hurley; GJ Hughes

Growth, ambient stability and electrical characterisation of MgO thin films on silicon surfaces

P Casey
, E O’Connor
, R Long
, B Brennan
, SA Krasnikov
, D O’Connell
, PK Hurley
, GJ Hughes

Sligo Research Office

Research output: Contribution to journal › Article › peer-review

30 Citations (Scopus)

Original language	Undefined/Unknown
Pages (from-to)	1711-1714
Number of pages	4
Journal	Microelectronic engineering
Volume	86
Issue number	7-9
Publication status	Published - 2009

Cite this

@article{f0d529374cb149aaa11e03864ed9706c,

title = "Growth, ambient stability and electrical characterisation of MgO thin films on silicon surfaces",

author = "P Casey and E O{\textquoteright}Connor and R Long and B Brennan and SA Krasnikov and D O{\textquoteright}Connell and PK Hurley and GJ Hughes",

year = "2009",

language = "Undefined/Unknown",

volume = "86",

pages = "1711--1714",

journal = "Microelectronic engineering",

publisher = "Elsevier",

number = "7-9",

}

TY - JOUR

T1 - Growth, ambient stability and electrical characterisation of MgO thin films on silicon surfaces

AU - Casey, P

AU - O’Connor, E

AU - Long, R

AU - Brennan, B

AU - Krasnikov, SA

AU - O’Connell, D

AU - Hurley, PK

AU - Hughes, GJ

PY - 2009

Y1 - 2009

M3 - Article

VL - 86

SP - 1711

EP - 1714

JO - Microelectronic engineering

JF - Microelectronic engineering

IS - 7-9

ER -