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Measurement of Schottky barrier height tuning using dielectric dipole insertion method at metal--semiconductor interfaces by photoelectron spectroscopy and electrical characterization techniques

  • Brian E Coss
  • , Prasanna Sivasubramani
  • , Barry Brennan
  • , Prashant Majhi
  • , Robert M Wallace
  • , Jiyoung Kim

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)
Original languageUndefined/Unknown
JournalJournal of Vacuum Science Technology B
Volume31
Issue number2
Publication statusPublished - 2013

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