Models for optimization of production environmental stress testing on electronic circuit packs

Engineering

• Networks (Circuits) 100%
• Demonstrates 50%
• Reliability Growth 50%
• Normal Distribution 50%
• Elapsed Time 50%
• Sequential Mode 50%
• Lognormal Distribution 50%
• Production Data 50%

Mathematics

• Linear Models 100%
• Weibull Distribution 50%
• Poisson Regression 50%
• Covariate 50%
• Gaussian Distribution 50%