@article{a7c6f7f7133e4e51af8bdc0c76cd8081,
title = "The Characterization and Passivation of Fixed Oxide Charges and Interface States in the Al2O3/InGaAs MOS System",
author = "Hurley, \{Paul K\} and {\'E}amon O'Connor and Vladimir Djara and Scott Monaghan and Povey, \{Ian M\} and Long, \{Rathnait D\} and Brendan Sheehan and Jun Lin and McIntyre, \{Paul C\} and Barry Brennan",
year = "2013",
language = "Undefined/Unknown",
volume = "13",
pages = "429--443",
journal = "IEEE Transactions on Device and Materials Reliability",
publisher = "IEEE Computer Society",
number = "4",
}