Abstract
The life-time of normal incidence collectors used in LPP EUV sources has been computationally investigated. A two-dimensional/ axisymmetric hydrodynamic-particle code is used to model the plasma expansion from the laser-droplet interaction up to the collector optic. The plasma is formed from the interaction of a Nd:YAG laser, operating at the fundamental frequency, with 50μm tin droplets. The simulation results show non-uniform mass-density distributions at the end of the laser pulse. As the expansion continues up to the collector, the non-uniformities continue to develop. Sn5+ is the most energetic ion impinging on the collector, with kinetic energies up to 7keV. The sputtering yields for Sn ions onto Mo and Si show a strong dependence on both the ion energy and their impact angle. The deposition of neutral tin atoms on the collector has also been assessed with a large scale hydrodynamic simulation. These results are used to investigate the build-up of tin vapor at the irradiation site.
Original language | English |
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Title of host publication | Extreme Ultraviolet (EUV) Lithography |
DOIs | |
Publication status | Published - 2010 |
Externally published | Yes |
Event | Extreme Ultraviolet (EUV) Lithography - San Jose, CA, United States Duration: 22 Feb 2010 → 25 Feb 2010 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 7636 |
ISSN (Print) | 0277-786X |
Conference
Conference | Extreme Ultraviolet (EUV) Lithography |
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Country/Territory | United States |
City | San Jose, CA |
Period | 22/02/10 → 25/02/10 |
Keywords
- EUV source
- atomic physics
- computational
- hydrodynamics
- laser plasma
- lithography